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EPM3128ATC100-10N ALTERA TQFP100 www.ic-stocks.com

  • Autore:lulu
  • fonte:www.ic-stocks.com
  • Rilascio:2018-11-19
Features...

■ High–performance, low–cost CMOS EEPROM–based programmable logic devices (PLDs) built on a MAX® architecture (see Table 1)

■ 3.3-V in-system programmability (ISP) through the built–in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface with advanced pin-locking capability – ISP circuitry compliant with IEEE Std. 1532

■ Built–in boundary-scan test (BST) circuitry compliant with IEEE Std. 1149.1-1990

■ Enhanced ISP features: – Enhanced ISP algorithm for faster programming – ISP_Done bit to ensure complete programming – Pull-up resistor on I/O pins during in–system programming

■ High–density PLDs ranging from 600 to 10,000 usable gates

■ 4.5–ns pin–to–pin logic delays with counter frequencies of up to 227.3 MHz

■ MultiVoltTM I/O interface enabling the device core to run at 3.3 V, while I/O pins are compatible with 5.0–V, 3.3–V, and 2.5–V logic levels

■ Pin counts ranging from 44 to 256 in a variety of thin quad flat pack (TQFP), plastic quad flat pack (PQFP), plastic J–lead chip carrier (PLCC), and FineLine BGATM packages

■ Hot–socketing support

■ Programmable interconnect array (PIA) continuous routing structure for fast, predictable performance

■ Industrial temperature range

...and More Features

■ PCI compatible

■ Bus–friendly architecture including programmable slew–rate control

■ Open–drain output option

■ Programmable macrocell flipflops with individual clear, preset, clock, and clock enable controls

■ Programmable power–saving mode for a power reduction of over 50% in each macrocell

■ Configurable expander product–term distribution, allowing up to 32 product terms per macrocell

■ Programmable security bit for protection of proprietary designs

■ Enhanced architectural features, including: – 6 or 10 pin– or logic–driven output enable signals – Two global clock signals with optional inversion – Enhanced interconnect resources for improved routability – Programmable output slew–rate control

■ Software design support and automatic place–and–route provided by Altera’s development systems for Windows–based PCs and Sun SPARCstations, and HP 9000 Series 700/800 workstations

■ Additional design entry and simulation support provided by EDIF 2 0 0 and 3 0 0 netlist files, library of parameterized modules (LPM), Verilog HDL, VHDL, and other interfaces to popular EDA tools from third–party manufacturers such as Cadence, Exemplar Logic, Mentor Graphics, OrCAD, Synopsys, Synplicity, and VeriBest

■ Programming support with the Altera master programming unit (MPU), MasterBlasterTM communications cable, ByteBlasterMVTM parallel port download cable, BitBlasterTM serial download cable as well as programming hardware from third–party manufacturers and any in–circuit tester that supports JamTM Standard Test and Programming Language (STAPL) Files (.jam), Jam STAPL Byte-Code Files (.jbc), or Serial Vector Format Files (.svf)

General Description

MAX 3000A devices are low–cost, high–performance devices based on the Altera MAX architecture. Fabricated with advanced CMOS technology, the EEPROM–based MAX 3000A devices operate with a 3.3-V supply voltage and provide 600 to 10,000 usable gates, ISP, pin-to-pin delays as fast as 4.5 ns, and counter speeds of up to 227.3 MHz. MAX 3000A devices in the –4, –5, –6, –7, and –10 speed grades are compatible with the timing requirements of the PCI Special Interest Group (PCI SIG) PCI Local Bus Specification, Revision 2.2.

The MAX 3000A architecture supports 100% transistor-to-transistor logic (TTL) emulation and high–density small-scale integration (SSI), medium-scale integration (MSI), and large-scale integration (LSI) logic functions. The MAX 3000A architecture easily integrates multiple devices ranging from PALs, GALs, and 22V10s to MACH and pLSI devices. MAX 3000A devices are available in a wide range of packages, including PLCC, PQFP, and TQFP packages.

Note: (1) When the IEEE Std. 1149.1 (JTAG) interface is used for in–system programming or boundary–scan testing, four I/O pins become JTAG pins.

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